Location:
Willow Creek Center, Room 311, 241 SW Edgeway
Drive Beaverton, OR 97006 (near Willow Creek MAX Station at 185th
Ave. and Baseline).
Time: Monday and Wednesday 5:00P – 6:50P
Glenn Shirley, PSU ECE
Scott Johnson, Intel.
Ph. (503) 613-3862
Day |
Topics |
Reading |
Problems and Projects |
Slides |
|
1 |
Monday |
Preliminaries, Introduction, Excel Exercise (Scott and Glenn) |
T&T Chapter 1, Sec. 1-4, 7-8 |
Homework due Jan 14, 3P: Exercise 1.1 |
Recording (Video of slides is missing, so follow with posted slides.) |
2 |
Wednesday |
Plotting and Fitting Data (Scott) |
T&T Chapter 2, Sec. 1-6,9. |
Homework due Jan 16, 3P: Exercises 2.1 and 2.3 |
|
3 |
Monday |
Reliability Functions (Scott) |
T&T |
Homework due Jan 23, 3P: Exercises 3.1a, b, c. |
Slides for Lecture 3 Recording |
4 |
Wednesday |
Reliability Plotting 1 (Scott) |
T&T Chapter 6, Sec. 1-6. |
Homework due Jan 28, 3P: Exercises 4.1, 4.2, 4.3. |
|
Holiday |
Monday |
Holiday. MLK Day. |
|||
5 |
Wednesday |
Reliability Plotting 2 (Scott) |
Workbook - Plotting 3 Homework due Jan 30, 3P: Exercises 5.1, 5.2, 5.3 Solutions |
Slides for Lecture 5 Recording |
|
6 |
Monday |
Confidence Limits (Scott) |
Workbook - Confidence Limits Homework due on Feb 4, 3P: Exercises 6.1, 6.2, 6.3. Solutions |
Slides for Lecture
6 Web App: Sampling Web App: Hypothesis Test Recording |
|
7 |
Wednesday |
Goodness of Fit, Maximum Likelihood (Scott) |
Workbook
- Goodness of Fit, MLE Homework due on Feb 6, 3P: Exercise 7.1 Solutions |
Slides for Lecture 7 Recording |
|
8 |
Monday |
Acceleration, MLE (Scott) |
Workbook - Acceleration, MLE Homework due on Feb 11, 3P: 8.1, 8.2, 8.3, 8.4 Solutions Cougar Point Example |
Slides for Lecture 8 Recording |
|
9 |
Wednesday |
Silicon Mechanisms, MLE (Scott) |
Workbook - Si Mechanisms, MLE Homework due on Feb 13, 3P: 9.1a, 9.2a, 9.2c, 9.3a, 9.3b Solutions (Will be posted on Feb 11.) |
Slides for Lecture 9 Recording |
|
|
Monday |
Pre-Exam Review (Scott) |
Recording |
||
Exam |
Wednesday |
Midterm Exam |
Exam Solution Workbook. Exam Solution Text. |
Exam Workbook Exam Text |
|
10 |
Monday |
Package Mechanisms and Qual Methodology 1(Glenn) |
Paper by Klinger on moisture AF models. |
Rel
Calculator Homework due on Feb 25, 3P: Exercises 10.1, 10.2, 10.3 --> Solution |
Slides for Lecture 10,
Rev 2. Slide 41 deleted, slide 40 tidied up. Recording. (Yaay!!) |
11 |
Wednesday |
Package Mechanisms and Qual Methodology 2(Glenn) |
Homework due on Feb 27: Exercises 11.1, 11.2 |
Slides for Lecture 11,
Rev 2 with mostly only the slides actually covered. Recording. (Also Yaay!!) |
|
12 |
Monday |
III-V Reliability Mechanisms (Bill Roesch, Triquint) |
Article by Bill Roesch in "Compound Semiconductor" Magazine Jan/Feb 2013, p65 |
Slides for
Lecture 12. Recording |
|
13 |
Wednesday |
Defect Models 1 (Glenn) |
Homework
13.1 due March 6 |
Slides for Lecture 13 Recording |
|
14 |
Monday |
Defect Models 2 (Glenn) |
Homework 14.1
(solution) due March 11 KMG Fitting Demo Synthesizer Demo Multi Plotter Tool |
Slides for
Lecture 14 Recording |
|
15 |
Wednesday |
Test Methods 1 (Glenn) |
1997 Nigh et. al. "An Experimental Study.." | Homework 15.1 (solution). (Use the OC Picker Tab in Rel Calculator Tool.) |
Slides for Lecture 15
(Re-corrected) Recording |
16 |
Monday |
Test Methods 2 (Glenn) |
Sematech Data (SQLite). Sematech Data(Excel) Single Plotter (Tool). Wafer Mapper (Tool) |
Slides for Lecture 16
(Corrected) Recording |
|
|
Wednesday |
Review Session |
Echo Student Survey | Recording | |
Exam Week |
Monday |
Final Exam |
Exam Workbook |
Exam Exam (Word Version) |
P. A. Tobias and D. C. Trindade, “Applied Reliability,” 3rd Edition, Chapman and Hall/CRC (2011)
Claire Churcher, “Beginning SQL Queries”, 1st Edition, Apress (2008)
W. Q. Meeker and Luis A. Escobar, “Statistical Methods for Reliability Data” Wiley-Interscience (1998)
W. Nelson, “Applied Life Data Analysis” Wiley, New York, 1982.
W. Nelson, “Accelerated Testing,” Wiley, New York, 1990.
International Technology Roadmap for Semiconductors
NIST Engineering Statistics Handbook.
Weibull, Waloddi, A Statistical Distribution of Wide Applicability, Journal of Applied Mechanics, 1951 pp. 293-297.
P. Nigh, W. Needham, K. M. Butler, P. C. Maxwell, R. C. Aitken, "An Experimental Study Comparing the Relative Effectiveness of Functional Scan, Iddq, and Delay Fault Testing, " 15th IEEE VLSI Test Symposium 1997, pp 459-464.