Copula Methods

Copula methods have been used for more than a decade in finance, actuarial science and earth sciences.  There is a large literature on copulas.  A good place to start is the book by Roger Nelsen (“An Introduction to Copulas”) and the review by Trivedi and Zimmer (“Copula Modeling: An Introduction for Practitioners”).  Although copula methods are clearly an important generalization of the multivariate normal modeling approach used to model semiconductor yield and quality and reliability, the existing copula literature gives no guidance on how to use copula methods to model semiconductor manufacturing and use.  So, the Integrated Circuit Design and Test (ICDT) Laboratory at PSU used DRAM variable retention time data acquired in ICDT as a case study to develop the essential elements of copula-based modeling of a semiconductor product.  Generalization to any kind of semiconductor product from the methods described here for the relatively simple DRAM case will be clear to practitioners.

Offered here are documents which describe the method, expand upon various aspects, and document some of the things we learned about copula methods.

Documents Related to the DRAM Case Study

Other Copula Learnings.