Select the Test/Screen option to load, create, save, and delete test/screen conditions. If a test/screen condition is already loaded when you activate the Test/Screen Library, its name appears after the Active Screen Condition menu bar header (see Figure 39). The Screen Condition option contains five commands:
 

• Load enables you to activate test/screen conditions already in the test/screen conditions database.
• New enables you to create new test/screen conditions.
• Save enables you to save the test/screen condition.
• Saveas enables you to save an existing test/screen condition under another name.
• Delete enables you to remove an existing test/screen conditions from the Test/screen Library.

• Select the Load command from the Test/Screen Condition menu. A list of all existing test/screen conditions in the Library appears (see Figure 40).

  Figure 40. The Load picklist  
• Select the test/screen condition you want to activate. You return to the Test/Screen Library screen. The test/screen condition name appears in the Active Screen Condition menu bar header. The File Name appears in the upper-right hand corner.

To view the parameters of the test/screen condition before selecting it, press Alt-P. A list of the parameters appears (see Figure 41). The parameters cannot be changed in this mode. All the test condition parameters are defined on pages 8-21 to 8-24.
 

Some screen conditions have a Acceleration Power Spectral Density (APSD) profile in their Parameters window. To view it, click on APSD or press Alt-G. A graphics window shows the PSD-versus-frequency profile for the test/screen condition.

All test/screen condition parameter windows have a Description field containing the name assigned the test/screen condition file. Pressing F1 calls a Comments window that contains information about the test/screen condition, such as its purpose and source. Many of the terms below are further defined in the Glossary in Appendix C.

                                    The Temperature category

• Temperature Mode
• Max. Temperature
• Min. Temperature
• Dwell Time at Max Temp.
• Dwell Time at Min Temp.
• Ramp Time (Min to Max Temp.)
• Number of Temperature Cycles

• Vibration Mode
• PSD Curve
• Max G
• Excitation Frequency
• Wave Form
• The Time of the Pulse
• Max Acceleration
• Device X Orientation
• Device Y Orientation
• Device Z Orientation

• Pressure Mode
• Max. Pressure
• Min. Pressure
• Dwell Time at Max P.
• Dwell Time at Min. P.
• Ramp Time (Min to Max P)
• Ramp Time (Max to Min P)
• Number of Pressure Cycles

• ESD Current pulse rise time
• ESD Current pulse delay time
• ESD Peak Current
• ESD Voltage

• Power Cycles/Year

• Radiation
• Radiation Energy
• Radiation Flux
• Radiation Dose
• Radiation Dose Rate
• Radiation Pulse Width