Index of /~cgshirl/Documents

[ICO]NameLast modifiedSizeDescription
[PARENTDIR]Parent Directory  -  
[ ]6-45nm_Transistor_Reliability.pdf2009-04-01 17:40 1.0M 
[ ]22a101b 8585.pdf2009-06-04 15:08 44K 
[ ]22a102c Steam.pdf2009-06-04 15:08 28K 
[ ]22a103c High Temperature Storage Life.pdf2009-06-04 15:08 77K 
[ ]22a104b Temperature Cycling.pdf2009-06-04 15:08 70K 
[ ]22a106b Thermal Shock.pdf2009-06-04 15:08 186K 
[ ]22a110b Biased HAST.pdf2009-06-04 15:08 62K 
[ ]22a113d Preconditioning.pdf2009-06-04 15:08 291K 
[ ]1967 Blacks Law IRPS .pdf2009-04-16 13:40 1.1M 
[ ]1969 Black Proc IEEE.pdf2009-04-01 17:40 2.8M 
[ ]1969 Black Trans ED.pdf2009-04-01 17:40 1.3M 
[ ]1974 Black Electromigration IRPS.pdf2009-04-01 17:40 8.3M 
[ ]1978 Black Electromigration IRPS.pdf2009-04-01 17:40 8.1M 
[ ]1982 Black IRPS.pdf2009-04-01 17:40 6.0M 
[ ]1985 Steady-state temperature profiles.. J. Appl Phys V57 p777 (1985).pdf2009-04-01 17:40 742K 
[ ]1986 Applications of Test Chips in Packaging and Assembly Shirley Bose Blish.pdf2009-04-01 17:40 1.8M 
[ ]1988 Schafft Lechner et al IRPS 1998.pdf2009-04-01 17:40 831K 
[ ]1990 Electrical Measurement of Moisture Penetration Shirley Maston IRPS p72 (1990).pdf2009-04-01 17:40 1.2M 
[ ]1991 Optimal Acceleration of Cyclic THB Shirley Hong IRPS p12 (1991).pdf2009-04-01 17:40 1.2M 
[ ]1993 IRPS93 Polyimide Moisture Rel.pdf2009-04-01 17:40 394K 
[ ]1994 New Generation HAST System Final Report.pdf2009-04-01 17:40 382K 
[ ]1995 A Defect Model of Reliability IRPS95 Tutorial Manuscript.pdf2009-04-01 17:40 106K 
[ ]1998 Kitano et al IRPS 1998.pdf2009-04-01 17:40 509K 
[ ]1998 Rzepka Hu.pdf2009-04-01 17:40 142K 
[ ]1999 Riordan Miller Sherman Hicks IRPS 1999.pdf2009-04-01 17:40 1.1M 
[ ]2001 Stathis Physical and predictive models of ultrathin oxide reliability TDMR.pdf2009-05-21 22:53 338K 
[ ]2002 Suehle Ultrathin gate oxide reliability IEEE TED.pdf2009-05-21 22:53 255K 
[ ]2003 Schroder Babcock Negative bias temperature instability JAP.pdf2009-05-21 22:53 456K 
[ ]2004 Synthesis of Correlated Data Rev 1 (Intel).pdf2009-04-01 17:40 737K 
[ ]2005 Baumann Soft Error.pdf2009-04-16 13:41 381K 
[ ]2005 Biswas ISCA.pdf2009-04-16 13:40 195K 
[ ]2005 Erratic Fluctuations of SRAM Cache Vmin IRPS 2005.pdf2009-04-01 17:40 301K 
[ ]2005 Nguyen et al Soft Error.pdf2009-04-16 13:41 557K 
[ ]2005 Ribes et al Review on high k dielectrics reliability issues TDMR.pdf2009-05-21 22:53 845K 
[ ]2005 Seifert et al IRPS Circuit Soft Error.pdf2009-04-16 13:41 1.5M 
[ ]2006 IRPS Paper Number 3E2 Ambient UC Intel Rev 9.pdf2009-04-01 17:40 628K 
[DIR]2007 ITRS/2011-08-24 17:37 -  
[ ]2007 Nicollian et al The current understanding of the trap generation mechanism IRPS.pdf2009-05-21 22:53 682K 
[ ]2007 US Patent 07197670_1.pdf2009-04-01 17:40 630K 
[ ]2008 IRPS 1.pdf2009-04-01 17:40 1.5M 
[ ]2008 IRPS 2.pdf2009-04-01 17:40 153K 
[ ]AP_Paper.pdf2009-04-01 17:40 3.2M 
[DIR]Demonstrations/2015-12-04 01:30 -  
[ ]ECE 516_416 Reliability 01.pdf2016-03-02 18:46 3.6M 
[ ]ECE 516_416 Reliability 02.pdf2017-02-19 15:24 3.7M 
[ ]ECE 516_416 Reliability 03.pdf2021-01-18 00:28 3.8M 
[ ]Electromigration - Wikipedia, the free encyclopedia.url2009-04-01 17:40 259  
[ ]Galloway Miles.pdf2009-04-01 17:40 139K 
[ ]IRPS2008Keynote101web pecht.pdf2009-04-01 17:40 1.8M 
[ ]Nishiyama Nakamura.pdf2009-04-01 17:40 606K 
[DIR]QRE_ECE510/2022-05-01 19:03 -  
[DIR]Research/2015-09-28 14:43 -  
[ ]Rzepka Hu.pdf2009-04-01 17:40 156K 
[ ]SER.pdf2009-06-04 15:08 832K 
[DIR]Supplementary Papers/2011-08-24 17:39 -  
[ ]Weibull-ASME-Paper-1951.pdf2009-04-13 00:48 1.6M 
[DIR]_vti_cnf/2021-01-18 00:30 -  
[ ]desktop.ini2015-08-28 15:42 114  
[ ]jep122E.pdf2009-04-01 17:40 1.7M 
[ ]plastic95.pdf2009-04-01 17:40 136K 
[ ]ras.pdf2009-04-01 17:40 148K 
[ ]satoshi_em_test_structure.pdf2009-06-05 17:47 2.3M